Electron-Paramagnetic Resonance Of Defects In Doped Microcrystalline Silicon

AuthID
P-001-T1B
7
Author(s)
LAVADO, M
·
GUIMARAES, L
Document Type
Article
Year published
1989
Published
in VACUUM, ISSN: 0042-207X
Volume: 39, Issue: 7-8, Pages: 791-794 (4)
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Publication Identifiers
SCOPUS: 2-s2.0-0024876089
Wos: WOS:A1989AP86900039
Source Identifiers
ISSN: 0042-207X
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