Evaluation of Idd/Vout Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

AuthID
 P-00J-XMX
2
Author(s)
Document Type
Proceedings Paper
Year published
1996
Published
in 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996 in ED&TC
Pages: 264-269
Conference
1996 European Conference on Design and Test, Edtc 1996, Date: 11 March 1996 through 14 March 1996, Sponsors: ACM Special Interest Group on Design Automation (SIGDA)
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Scopus®
Dblp®/en/publications/view/620189
Crossref®1
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Publication Identifiers
Dblp: conf/date/SilvaM96
Scopus: 2-s2.0-85030104109
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