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Evaluation of Idd/Vout Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

AuthID
P-00J-XMX

Author(s)

Machado Da Silva, J

Silva Matos, J

Document Type

Proceedings Paper

Year published

1996

Published

in Proceedings of the 1996 European Conference on Design and Test, EDTC 1996

Pages: 264-268

Conference

1996 European Conference on Design and Test, Edtc 1996, Date: 11 March 1996 through 14 March 1996, Sponsors: ACM Special Interest Group on Design Automation (SIGDA)

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Publication Identifiers

DOI: 10.1109/edtc.1996.494159

SCOPUS: 2-s2.0-85030104109

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Evaluation of Idd/Vout Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

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Evaluation of Idd/Vout Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

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