Statistically Enhanced Analogue and Mixed-Signal Design and Test

AuthID
 P-00M-5ZE
4
Author(s)
Document Type
Proceedings Paper
Year published
2016
Published
in PROCEEDINGS OF THE 2016 IEEE 21ST INTERNATIONAL MIXED-SIGNALS TEST WORKSHOP (IMSTW)
Conference
21Th Ieee International Mixed-Signals Test Workshop (Imstw), Date: JUL 04-06, 2016, Location: Sant Feliu de Guixols, SPAIN, Sponsors: IEEE, IEEE Comp Soc, Test Technol Tech Council, CNRS, Grenoble INP, Univ Joseph Fourier, Dialog Semicond, ams AG, Xilinx, TIMA Lab, LIP6
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Publication Identifiers
SCOPUS: 2-s2.0-84992107987
Unpaywall: 10.1109/ims3tw.2016.7524221
Wos: WOS:000391254600003
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