Adaptive Self-Organizing Map Applied to Lathe Tool Condition Monitoring

AuthID
 P-00N-E46
2
Author(s)
Reis, R
Document Type
Proceedings Paper
Year published
2017
Published
in 2017 22ND IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION (ETFA) in IEEE International Conference on Emerging Technologies and Factory Automation-ETFA, ISSN: 1946-0740
Volume: Part F134116, Pages: 1-6 (6)
Conference
22Nd Ieee International Conference on Emerging Technologies and Factory Automation (Etfa), Date: SEP 12-15, 2017, Location: Limassol, CYPRUS, Sponsors: IEEE, ABB, ies, Univ Cyprus, Dept Elect Comp Engn
Indexing
Wos®
Scopus®
Dblp®/en/publications/view/702598
Crossref®3
Google Scholar®
Publication Identifiers
Dblp: conf/etfa/SilvaR17
Scopus: 2-s2.0-85044461317
Wos: WOS:000427812000076
Source Identifiers
ISSN: 1946-0740
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