Local Binary Patterns for Document Forgery Detection

AuthID
 P-00N-JST
5
Author(s)
Cruz, F
·
Coustaty, M
·
Ogier, JM
Document Type
Proceedings Paper
Year published
2017
Published
in 14th IAPR International Conference on Document Analysis and Recognition, ICDAR 2017, Kyoto, Japan, November 9-15, 2017 in ICDAR
Pages: 1223-1228
Indexing
Dblp®/en/publications/view/707386
Publication Identifiers
Dblp: conf/icdar/CruzSCDO17
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