Delay Sensing for Parametric Variations and Defects Monitoring in Safety-Critical Applications

AuthID
P-00P-54Q
7
Author(s)
Vazquez, JC
·
Champac, V
·
Ziesemer, AM
·
Reis, R
·
Teixeira, IC
·
Santos, MB
·
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS) in IEEE Latin American Symposium on Circuits and Systems, ISSN: 2330-9954
Pages: 148-151 (4)
Conference
1St Ieee Latin American Symposium on Circuits and Systems (Lascas), Date: FEB 24-26, 2010, Location: BAHAMAS, Sponsors: IEEE, IEEE Circuits & Syst Soc, SBC, SBM, UFRGS
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Publication Identifiers
Wos: WOS:000392285500046
Source Identifiers
ISSN: 2330-9954
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