Control and Observation of Analog Nodes in Mixed-Signal Boards

AuthID
 P-00P-S20
3
Author(s)
Leão, AC
·
Document Type
Proceedings Paper
Year published
1993
Published
in Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993
Pages: 323-331
Indexing
Dblp®/en/publications/view/746560
Publication Identifiers
DBLP: conf/itc/MatosLF93
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