Architecture of Test Support Ics for Mixed-Signal Testing

AuthID
 P-00P-S25
4
Author(s)
Leão, AC
·
Silva, JM
Document Type
Proceedings Paper
Year published
1994
Published
in 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA in VTS
Pages: 240-246
Indexing
Dblp®/en/publications/view/746565
Publication Identifiers
DBLP: conf/vts/MatosFLS94
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