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Test Patterns for Iot
AuthID
P-00P-WJQ
P-00P-WJQ
3
Author(s)
3
Editor(s)
Prasetya, W; Vos, TEJ; Getir, S
Document Type
Proceedings Paper
Year published
2018
Published
in PROCEEDINGS OF THE 9TH ACM SIGSOFT INTERNATIONAL WORKSHOP ON AUTOMATING TEST CASE DESIGN, SELECTION, AND EVALUATION (A-TEST '18) in A-TEST@ESEC/SIGSOFT FSE
Pages: 63-66 (4)
Conference
9Th Acm Sigsoft International Workshop on Automating Test Case Design, Selection, and Evaluation (A-Test), Date: NOV 05, 2018, Location: Lake Buena Vista, FL, Sponsors: Assoc Comp Machinery, ACM SIGSOFT
Publication Identifiers
Dblp: conf/sigsoft/PontesLF18
Scopus: 2-s2.0-85061771105
Wos: WOS:000474463100011
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