Publications

An Empirical Study on the Use of Defect Prediction for Test Case Prioritization

AuthID
P-00Q-RH9

Author(s)

Paterson, D

Campos, J

Abreu, R

Kapfhammer, GM

Fraser, G

McMinn, P

Document Type

Proceedings Paper

Year published

2019

Published

in 2019 IEEE 12TH CONFERENCE ON SOFTWARE TESTING, VALIDATION AND VERIFICATION (ICST 2019) in IEEE International Conference on Software Testing Verification and Validation, ISSN: 2381-2834

Pages: 346-357 (12)

Conference

12Th Ieee International Conference on Software Testing, Verification and Validation (Icst), Date: APR 22-27, 2019, Location: Xian, PEOPLES R CHINA, Sponsors: IEEE, IEEE Comp Soc, CCF, Xian Jiaotong Univ, Xian Univ Posts & Telecommunicat, Huawei, Beijing Sunwise Informat Technol Ltd, Baidu, www 360 cn, Netflix, TICPSH, Mooctest, Google

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