An Empirical Study on the Use of Defect Prediction for Test Case Prioritization

AuthID
 P-00Q-RH9
6
Author(s)
Paterson, D
·
Kapfhammer, GM
·
Fraser, G
·
McMinn, P
Document Type
Proceedings Paper
Year published
2019
Published
in 2019 IEEE 12TH CONFERENCE ON SOFTWARE TESTING, VALIDATION AND VERIFICATION (ICST 2019) in IEEE International Conference on Software Testing Verification and Validation, ISSN: 2381-2834
Pages: 346-357 (12)
Conference
12Th Ieee International Conference on Software Testing, Verification and Validation (Icst), Date: APR 22-27, 2019, Location: Xian, PEOPLES R CHINA, Sponsors: IEEE, IEEE Comp Soc, CCF, Xian Jiaotong Univ, Xian Univ Posts & Telecommunicat, Huawei, Beijing Sunwise Informat Technol Ltd, Baidu, www 360 cn, Netflix, TICPSH, Mooctest, Google
Indexing
Wos®
Scopus®
Dblp®/en/publications/view/778793
Crossref®14
Google Scholar®
Publication Identifiers
DBLP: conf/icst/PatersonCAKFM19
SCOPUS: 2-s2.0-85067914621
Wos: WOS:000477739000031
Source Identifiers
ISSN: 2381-2834
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