Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating

AuthID
P-00R-CFS
7
Author(s)
Sheikh, M
·
Rajabdorri, M
·
Niknam, T
·
Document Type
Article
Year published
2019
Published
in IEEE SYSTEMS JOURNAL, ISSN: 1932-8184
Volume: 13, Issue: 4, Pages: 3933-3943 (11)
Indexing
Publication Identifiers
DBLP: journals/sj/SheikhALRNSC19
SCOPUS: 2-s2.0-85074843994
Wos: WOS:000503182300034
Source Identifiers
ISSN: 1932-8184
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.