A Simple Approach to the Capacitance Technique for Determination of Interface State Density of a Metal-Semiconductor Contact

AuthID
 P-00W-RCA
2
Author(s)
Kal S.
Document Type
Article
Year published
1998
Published
in Solid-State Electronics, ISSN: 00381101
Volume: 42, Issue: 6, Pages: 943-949 (6)
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Scopus®
Crossref®75
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Publication Identifiers
Scopus: 2-s2.0-0032089820
Source Identifiers
ISSN: 00381101
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