A Simple Approach to the Capacitance Technique for Determination of Interface State Density of a Metal-Semiconductor Contact

AuthID
 P-00W-RCA
2
Author(s)
Kal, S
Tipo de Documento
Article
Year published
1998
Publicado
in SOLID-STATE ELECTRONICS, ISSN: 0038-1101
Volume: 42, Número: 6, Páginas: 943-949 (7)
Indexing
Wos®
Scopus®
Crossref®75
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0032089820
Wos: WOS:000074542500011
Source Identifiers
ISSN: 0038-1101
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