Publications

On the Drain-To-Source Capacitance of Microwave Fets in Triode Region

AuthID
P-00X-AJ8

Author(s)

Gomes, JL

Nunes, LC

Pedro, JC

Document Type

Proceedings Paper

Year published

2022

Published

in 2022 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS 2022) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X

Volume: 2022-June, Pages: 333-335 (3)

Conference

Ieee/Mtt-S International Microwave Symposium (Ims), Date: JUN 19-24, 2022, Location: Denver, CO, Sponsors: IEEE,IEEE Microwave Theory & Tech Soc,RFIC,ARFTG,Analog Devices,Qorvo,Amplitech Grp,Rohde & Schwarz,Anokiwave,Cacence,Eravant,GlobalFoundries,Macom,MouryMicrowave,Millimeter Wave Prod Inc,Wolfspeed,XMA

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