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TÍTULO: CdTe detector use for PIXE characterization of TbCoFe thin films  Full Text
AUTORES: Chaves, PC ; Taborda, A ; Barradas, NP ; Miguel A. Reis ;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12
INDEXADO EM: Scopus WOS CrossRef
12
TÍTULO: High Resolution and Differential PIXE combined with RBS, EBS and AFM analysis of magnesium titanate (MgTiO3) multilayer structures  Full Text
AUTORES: Miguel A. Reis ; Alves, LC ; Barradas, NP ; Chaves, PC ; Nunes, B; Taborda, A ; Surendran, KP; Wu, A; Vilarinho, PM ; Alves, E ;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12
INDEXADO EM: Scopus WOS CrossRef: 14
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TÍTULO: Simulation of L X-ray yields induced by He ions  Full Text
AUTORES: Taborda, A ; Chaves, PC ; Miguel A. Reis ;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12
INDEXADO EM: Scopus WOS CrossRef
14
TÍTULO: High airborne PM2.5 chlorine concentrations link to diabetes surge in Portugal  Full Text
AUTORES: Miguel A. Reis ; Carvalho, A; Taborda, A ; Quaresma, A; Dias, G; Alves, LC ; Mota, M; Chaves, PC ; Teixeira, R; Rodrigues, PO;
PUBLICAÇÃO: 2009, FONTE: SCIENCE OF THE TOTAL ENVIRONMENT, VOLUME: 407, NÚMERO: 21
INDEXADO EM: Scopus WOS CrossRef
15
TÍTULO: DT2, a PIXE spectra simulation and fitting package  Full Text
AUTORES: Miguel A. Reis ; Chaves, PC ; Alves, LC ; Barradas, NP ;
PUBLICAÇÃO: 2008, FONTE: 11th International Conference on PIXE and its Analytical Applications in X-RAY SPECTROMETRY, VOLUME: 37, NÚMERO: 2
INDEXADO EM: Scopus WOS CrossRef
16
TÍTULO: Dependence of relative intensity of L-1 sub-shell X-rays on ion beam energy  Full Text
AUTORES: Chaves, PC ; Miguel A. Reis ; Barradas, NP ; Matjaz Kavcic;
PUBLICAÇÃO: 2007, FONTE: 19th International Conference on Application of Accelerators in Research and Industry in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 261, NÚMERO: 1-2
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Holistic RBS-PIXE data reanalysis of SBT thin film samples  Full Text
AUTORES: Miguel A. Reis ; Barradas, NP ; Pascual Lzarra, C; Chaves, PC ; Ramos, AR ; Alves, E ; Gonzalez Aguilar, G ; Costa, MEV ; Miranda M M Salvado ;
PUBLICAÇÃO: 2007, FONTE: 19th International Conference on Application of Accelerators in Research and Industry in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 261, NÚMERO: 1-2
INDEXADO EM: Scopus WOS CrossRef: 10
18
TÍTULO: Combination of IBA techniques for composition analysis of GaInAsSb films
AUTORES: Corregidor, V; Chaves, PC ; Miguel A. Reis ; Pascual Izarra, C; Alves, E ; Barradas, NP ;
PUBLICAÇÃO: 2006, FONTE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, NÚMERO: PART 2
INDEXADO EM: Scopus WOS CrossRef: 5
NO MEU: ORCID
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TÍTULO: PIXE capabilities for biogeochemical cycles studies in the North-Eastern Atlantic  Full Text
AUTORES: Miguel A. Reis ; Chaves, PC ; Leal, JP ; Cabecadas, MG; Rodrigues, AF ; Juliano, M; Th. T Wolterbeek;
PUBLICAÇÃO: 2006, FONTE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, NÚMERO: 1-2 SPEC. ISS.
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Detection angle resolved PIXE and the equivalent depth concept for thin film characterization  Full Text
AUTORES: Miguel A. Reis ; Chaves, PC ; Corregidor, V ; Barradas, NP ; Alves, E ; Dimroth, F; Bett, AW;
PUBLICAÇÃO: 2005, FONTE: 10th PIXE Conference in X-RAY SPECTROMETRY, VOLUME: 34, NÚMERO: 4
INDEXADO EM: Scopus WOS CrossRef
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