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António Manuel Cruz Serra
AuthID:
R-000-28E
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Proceedings Paper (66)
Article (56)
Editorial Material (2)
Review (1)
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Publicações Confirmadas: 125
21
TÃTULO:
A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems
Full Text
AUTORES:
Pedro M Ramos
;
Antonio Cruz Serra
;
PUBLICAÇÃO:
2008
,
FONTE:
17th IMEKO Congress
in
MEASUREMENT,
VOLUME:
41,
NÚMERO:
2
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
22
TÃTULO:
An efficient approach to detect and classify power quality disturbances
AUTORES:
Tomas Radil
;
Fernando M Janeiro
;
Pedro M Ramos
;
Cruz C Serra
;
PUBLICAÇÃO:
2008
,
FONTE:
COMPEL-THE INTERNATIONAL JOURNAL FOR COMPUTATION AND MATHEMATICS IN ELECTRICAL AND ELECTRONIC ENGINEERING,
VOLUME:
27,
NÚMERO:
5
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
23
TÃTULO:
Characterization of a new symmetrical cancelation method for Magnetic Induction Tomography
AUTORES:
Bras, NB
;
Martins, RC
;
Serra, AC
;
PUBLICAÇÃO:
2008
,
FONTE:
16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session
in
16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXADO EM:
Scopus
NO MEU:
ORCID
24
TÃTULO:
Detection and classification of transients and waveform distortions using an algorithm based on sine-fitting
AUTORES:
Ramos, PM
;
Radil, T
;
Serra, AC
;
PUBLICAÇÃO:
2008
,
FONTE:
16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session
in
16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXADO EM:
Scopus
NO MEU:
ORCID
25
TÃTULO:
Detection and Extraction of Harmonic and Non-harmonic Power Quality Disturbances Using Sine Fitting Methods
AUTORES:
Tomas Radil
;
Pedro M Ramos
;
Cruz C Serra
;
PUBLICAÇÃO:
2008
,
FONTE:
13th International Conference on Harmonics and Quality of Power
in
2008 13TH INTERNATIONAL CONFERENCE ON HARMONICS AND QUALITY OF POWER, VOLS 1 AND 2
INDEXADO EM:
WOS
26
TÃTULO:
Detection and extraction of harmonic and non-harmonic power quality disturbances using sine fitting methods
AUTORES:
Radii, T
;
Ramos, PM
;
Serra, AC
;
PUBLICAÇÃO:
2008
,
FONTE:
ICHQP 2008: 13th International Conference on Harmonics and Quality of Power
in
ICHQP 2008: 13th International Conference on Harmonics and Quality of Power
INDEXADO EM:
Scopus
NO MEU:
ORCID
27
TÃTULO:
Dimensioning and Characterization of a New Magnetic Induction Tomography Experimental Setup
Full Text
AUTORES:
Nuno B Bras
;
Alexandre Pestana
;
Rafil C Martins
;
Antnio C Serra
;
PUBLICAÇÃO:
2008
,
FONTE:
25th IEEE Instrumentation and Measurement Technology Conference
in
2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
28
TÃTULO:
Extensible mark-up language file definition for structured acquisition data storage and transfer
Full Text
AUTORES:
Nuno B Bras
;
Pedro M Ramos
;
Cruz C Serra
;
PUBLICAÇÃO:
2008
,
FONTE:
MEASUREMENT,
VOLUME:
41,
NÚMERO:
3
INDEXADO EM:
Scopus
WOS
29
TÃTULO:
FOUR-PARAMETER SINE-FITTING ALGORITHM FOR DETECTION AND CLASSIFICATION OF TRANSIENTS AND WAVEFORM DISTORTIONS
AUTORES:
Pedro M Ramos
;
Tomas Radil
;
Cruz C Serra
;
PUBLICAÇÃO:
2008
,
FONTE:
METROLOGY AND MEASUREMENT SYSTEMS,
VOLUME:
15,
NÚMERO:
4
INDEXADO EM:
Scopus
WOS
NO MEU:
ORCID
30
TÃTULO:
Frequency Estimation of Power System Signals Using a New Spectrum Leakage Correction Algorithm
Full Text
AUTORES:
Tomas Radil
;
Pedro M Ramos
;
Cruz C Serra
;
PUBLICAÇÃO:
2008
,
FONTE:
25th IEEE Instrumentation and Measurement Technology Conference
in
2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
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