31
TÍTULO: Signal processing for non-contact NDE
AUTORES: Michal Kubinyi; Adam Docekal; Helena G Ramos ; Artur L Ribeiro ;
PUBLICAÇÃO: 2010, FONTE: PRZEGLAD ELEKTROTECHNICZNY, VOLUME: 86, NÚMERO: 1
INDEXADO EM: Scopus WOS
NO MEU: ORCID
32
TÍTULO: 2D Magnetic Field Mobile Sensing System for Eddy Current Testing
AUTORES: Bruno Silva; Dario Pasadas; Frederico Carvalho; Pedro Agulha; Octavian Postolache ; Helena G Ramos ; Lopes Ribeiro, AL ; Correa Alegria, FC ;
PUBLICAÇÃO: 2009, FONTE: 8th IEEE Conference on Sensors in 2009 IEEE SENSORS, VOLS 1-3
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID
33
TÍTULO: Eddy Current Inspection of a Duralumin Plate  Full Text
AUTORES: Lopes L Ribeiro ; Francisco Alegria ; Postolache, O ; Geirinhas Ramos, HMG ;
PUBLICAÇÃO: 2009, FONTE: 26th IEEE International Instrumentation and Measurement Technology Conference in I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
INDEXADO EM: Scopus WOS CrossRef: 2
NO MEU: ORCID
34
TÍTULO: GMR Based Eddy Current Sensing Probe for Weld Zone Testing
AUTORES: Octavian Postolache ; Helena G Ramos ; Lopes L Ribeiro ; Correa C Alegria ;
PUBLICAÇÃO: 2009, FONTE: 8th IEEE Conference on Sensors in 2009 IEEE SENSORS, VOLS 1-3
INDEXADO EM: Scopus WOS CrossRef: 8
NO MEU: ORCID
35
TÍTULO: USING A MOUSE POINTER AS A POSITIONING DEVICE IN EDDY CURRENT TESTING
AUTORES: Lopes L Ribeiro ; Correa C Alegria ; Postolache, O ; Geirinhas G Ramos ; Simoes, M; Pimentel, J; Mauricio, P; Calvario, J; Carvalho, A; Rocha, T;
PUBLICAÇÃO: 2009, FONTE: 19th IMEKO World Congress in XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS, VOLUME: 1
INDEXADO EM: Scopus WOS
NO MEU: ORCID
36
TÍTULO: Using the Skin Effect to Estimate Cracks Depths in Mettalic Structures  Full Text
AUTORES: Geirinhas Ramos, HMG ; Postolache, O ; Correa C Alegria ; Lopes L Ribeiro ;
PUBLICAÇÃO: 2009, FONTE: 26th IEEE International Instrumentation and Measurement Technology Conference in I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
INDEXADO EM: Scopus WOS CrossRef: 11
NO MEU: ORCID
37
TÍTULO: WELD TESTING USING EDDY CURRENT PROBES AND IMAGE PROCESSING
AUTORES: Octavian Postolache ; Artur Lopes Ribeiro ; Helena Ramos ;
PUBLICAÇÃO: 2009, FONTE: 19th IMEKO World Congress in XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS, VOLUME: 1
INDEXADO EM: Scopus WOS
NO MEU: ORCID
38
TÍTULO: Characterization of defects in aluminum plates using GMR probes and neural network signal processing
AUTORES: Postolache, O ; Geirinhas Ramos, HG ; Lopes Ribeiro, AL ;
PUBLICAÇÃO: 2008, FONTE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXADO EM: Scopus
NO MEU: ORCID
39
TÍTULO: Signal processing in an eddy current non-destructive testing system
AUTORES: Ramos, HG ; Ribeiro, AL ; Radil, T; Kubinyi, M; Paval, M;
PUBLICAÇÃO: 2008, FONTE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXADO EM: Scopus
NO MEU: ORCID
40
TÍTULO: Development and characterization of a conductivity cell for water quality monitoring
AUTORES: Geirinhas Ramos, HM ; Ribeiro, AL ; Komarek, M; Novotny, M;
PUBLICAÇÃO: 2006, FONTE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 2
INDEXADO EM: Scopus
NO MEU: ORCID
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