Pedro Miguel da Silva Cabral
AuthID: R-000-EY7
21
TÃTULO: Impact of the Input Baseband Terminations on the Efficiency of Wideband Power Amplifiers under Concurrent Band Operation
AUTORES: Barros, DR; Nunes, LC; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2019, FONTE: IEEE Transactions on Microwave Theory and Techniques, VOLUME: 67, NÚMERO: 12
AUTORES: Barros, DR; Nunes, LC; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2019, FONTE: IEEE Transactions on Microwave Theory and Techniques, VOLUME: 67, NÚMERO: 12
22
TÃTULO: Theoretical Analysis of Nonlinear Amplification Effects in Massive MIMO Systems
AUTORES: Teodoro, S; Silva, A; Dinis, R; Barradas, FM; Cabral, PM; Gameiro, A;
PUBLICAÇÃO: 2019, FONTE: IEEE ACCESS, VOLUME: 7
AUTORES: Teodoro, S; Silva, A; Dinis, R; Barradas, FM; Cabral, PM; Gameiro, A;
PUBLICAÇÃO: 2019, FONTE: IEEE ACCESS, VOLUME: 7
23
TÃTULO: Magnetless RF Isolator Design Using Grounded Transistors
AUTORES: Barradas, FM; Cunha, TR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, VOLUME: 2018-June
AUTORES: Barradas, FM; Cunha, TR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, VOLUME: 2018-June
24
TÃTULO: Efficiency Degradation in Wideband Power Amplifiers
AUTORES: Nunes, LC; Barros, DR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, VOLUME: 2018-June
AUTORES: Nunes, LC; Barros, DR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, VOLUME: 2018-June
25
TÃTULO: Pulsed I/V and S-parameters measurement system for isodynamic characterization of power GaN HEMT transistors
AUTORES: Goncalves, CF; Nunes, LC; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, VOLUME: 28, NÚMERO: 8
AUTORES: Goncalves, CF; Nunes, LC; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, VOLUME: 28, NÚMERO: 8
26
TÃTULO: A Simple Method to Extract Trapping Time Constants of GaN HEMTs
AUTORES: Nunes, LC; Gomes, JL; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, VOLUME: 2018-June
AUTORES: Nunes, LC; Gomes, JL; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, VOLUME: 2018-June
27
TÃTULO: Efficiency Degradation Analysis in Wideband Power Amplifiers
AUTORES: Nunes, LC; Barros, DR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE-MTT-Society International Microwave Symposium (IMS) in IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 66, NÚMERO: 12
AUTORES: Nunes, LC; Barros, DR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2018, FONTE: IEEE-MTT-Society International Microwave Symposium (IMS) in IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 66, NÚMERO: 12
28
TÃTULO: Trapping behavior of GaN HEMTs and its implications on class B PA bias point selection. Trapping Behavior of GaN HEMTs-Implications on Bias Point Selection Full Text
AUTORES: Cabral, PM; Nunes, LC; Ressurreicao, T; Pedro, JC ;
PUBLICAÇÃO: 2017, FONTE: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, VOLUME: 30, NÚMERO: 1
AUTORES: Cabral, PM; Nunes, LC; Ressurreicao, T; Pedro, JC ;
PUBLICAÇÃO: 2017, FONTE: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, VOLUME: 30, NÚMERO: 1
29
TÃTULO: Compensation of Long-Term Memory Effects on GaN HEMT-Based Power Amplifiers
AUTORES: Barradas, FM; Nunes, LC; Cunha, TR; Lavrador, PM; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2017, FONTE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 65, NÚMERO: 9
AUTORES: Barradas, FM; Nunes, LC; Cunha, TR; Lavrador, PM; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2017, FONTE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 65, NÚMERO: 9
30
TÃTULO: Modeling PA linearity and efficiency in MIMO transmitters
AUTORES: Barradas, FM; Cunha, TR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2017, FONTE: IEEE-Microwave-Theory-and-Techniques-Society International Microwave Symposium (IMS) / Session on Women in Microwaves (WIM) in 2017 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
AUTORES: Barradas, FM; Cunha, TR; Cabral, PM; Pedro, JC ;
PUBLICAÇÃO: 2017, FONTE: IEEE-Microwave-Theory-and-Techniques-Society International Microwave Symposium (IMS) / Session on Women in Microwaves (WIM) in 2017 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
