Wael Dghais
AuthID: R-004-NF5
11
TÃTULO: Empirical modelling of FDSOI CMOS inverter for signal/power integrity simulation
AUTORES: Wael Dghais; Jonathan Rodriguez;
PUBLICAÇÃO: 2015, FONTE: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015
AUTORES: Wael Dghais; Jonathan Rodriguez;
PUBLICAÇÃO: 2015, FONTE: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015
INDEXADO EM: 
DBLP
DBLP12
TÃTULO: Memristor state-space embedding
AUTORES: Wael Dghais; Luis Nero Alves; Joana Catarina Mendes; Jonathan Rodriguez; José Carlos Pedro;
PUBLICAÇÃO: 2015, FONTE: European Conference on Circuit Theory and Design, ECCTD 2015, Trondheim, Norway, August 24-26, 2015
AUTORES: Wael Dghais; Luis Nero Alves; Joana Catarina Mendes; Jonathan Rodriguez; José Carlos Pedro;
PUBLICAÇÃO: 2015, FONTE: European Conference on Circuit Theory and Design, ECCTD 2015, Trondheim, Norway, August 24-26, 2015
INDEXADO EM: DBLP
DBLP13
TÃTULO: UTTB FDSOI Back-Gate Biasing for Low Power and High-Speed Chip Design
AUTORES: Wael Dghais; Jonathan Rodriguez;
PUBLICAÇÃO: 2014, FONTE: Wireless Internet - 8th International Conference, WICON 2014, Lisbon, Portugal, November 13-14, 2014, Revised Selected Papers, VOLUME: 146
AUTORES: Wael Dghais; Jonathan Rodriguez;
PUBLICAÇÃO: 2014, FONTE: Wireless Internet - 8th International Conference, WICON 2014, Lisbon, Portugal, November 13-14, 2014, Revised Selected Papers, VOLUME: 146
INDEXADO EM: DBLP
DBLP14
TÃTULO: Novel Extraction of a Table-Based I-Q Behavioral Model for High-Speed Digital Buffers/Drivers Full Text
AUTORES: Wael Dghais; Hugo. M Teixeira; Telmo R Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, NÚMERO: 3
AUTORES: Wael Dghais; Hugo. M Teixeira; Telmo R Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, NÚMERO: 3
15
TÃTULO: Measurement Setup for RF/Digital Buffers Characterization
AUTORES: Hugo M Teixeira; Wael Dghais; Telmo Reis Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, NÚMERO: 7
AUTORES: Hugo M Teixeira; Wael Dghais; Telmo Reis Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, NÚMERO: 7
16
TÃTULO: A Novel Two-Port Behavioral Model for I/O Buffer Overclocking Simulation Full Text
AUTORES: Wael Dghais; Telmo Reis Cunha; Jose Carlos Pedro ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, NÚMERO: 10
AUTORES: Wael Dghais; Telmo Reis Cunha; Jose Carlos Pedro ;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, NÚMERO: 10
17
TÃTULO: Reduced-Order Parametric Behavioral Model for Digital Buffers/Drivers With Physical Support Full Text
AUTORES: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2012, FONTE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 2, NÚMERO: 12
AUTORES: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2012, FONTE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 2, NÚMERO: 12
18
TÃTULO: A Mixed-Domain Behavioral Model's Extraction for Digital I/O Buffers
AUTORES: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2012, FONTE: IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) in 2012 IEEE 21ST CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS
AUTORES: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLICAÇÃO: 2012, FONTE: IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) in 2012 IEEE 21ST CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS
19
TÃTULO: Efficient table-based I-Q behavioral model for high-speed digital buffers/drivers
AUTORES: Dghais, W; Teixeira, HM; Cunha, TR ; Pedro, JC ;
PUBLICAÇÃO: 2012, FONTE: 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 in 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings
AUTORES: Dghais, W; Teixeira, HM; Cunha, TR ; Pedro, JC ;
PUBLICAÇÃO: 2012, FONTE: 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 in 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings
20
TÃTULO: Behavioral model for high-speed digital buffer/driver
AUTORES: Dghais, W; Cunha, TR ; Pedro, JC ;
PUBLICAÇÃO: 2010, FONTE: 2010 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 in 2010 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 - Conference Proceedings
AUTORES: Dghais, W; Cunha, TR ; Pedro, JC ;
PUBLICAÇÃO: 2010, FONTE: 2010 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 in 2010 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 - Conference Proceedings
