E. Cretu
AuthID: R-006-GVW
31
TITLE: The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTHORS: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2002, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2
AUTHORS: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2002, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2
INDEXED IN: 
WOS
WOS32
TITLE: The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTHORS: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2002, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTHORS: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2002, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: 
Scopus
Scopus33
TITLE: Micromechanical voltage reference using the pull-in of a beam
AUTHORS: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 6
AUTHORS: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 6
34
TITLE: Using the pull-in voltage as voltage reference
AUTHORS: Cretu, E; Rocha, LA ; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: 11th International Conference on Solid-State Sensors and Actuators in TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
AUTHORS: Cretu, E; Rocha, LA ; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: 11th International Conference on Solid-State Sensors and Actuators in TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
INDEXED IN: WOS
WOS35
TITLE: Minimizing temperature drift errors of conditioning circuits using artificial neural networks
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLISHED: 2000, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, ISSUE: 5
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLISHED: 2000, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, ISSUE: 5
36
TITLE: Circular displacement sensor using magnetostrictive amorphous wires
AUTHORS: Fosalau, C; Cretu, M; Postolache, O ;
PUBLISHED: 2000, SOURCE: IEEE Transactions on Magnetics, VOLUME: 36, ISSUE: 3
AUTHORS: Fosalau, C; Cretu, M; Postolache, O ;
PUBLISHED: 2000, SOURCE: IEEE Transactions on Magnetics, VOLUME: 36, ISSUE: 3
37
TITLE: Minimising temperature drift errors of conditioning circuits using artificial neural networks Full Text
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLISHED: 1998, SOURCE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLISHED: 1998, SOURCE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
INDEXED IN: Scopus WOS
Scopus WOS38
TITLE: A microinstrumentation system for industrial applications
AUTHORS: Correia, JH; Cretu, E; Bartek, M; Wolffenbuttel, RF;
PUBLISHED: 1997, SOURCE: IEEE International Symposium on Industrial Electronics in ISIE '97 - PROCEEDINGS OF THE IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-3, VOLUME: 3
AUTHORS: Correia, JH; Cretu, E; Bartek, M; Wolffenbuttel, RF;
PUBLISHED: 1997, SOURCE: IEEE International Symposium on Industrial Electronics in ISIE '97 - PROCEEDINGS OF THE IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-3, VOLUME: 3
INDEXED IN: Scopus WOS
Scopus WOS