António Manuel Cruz Serra
AuthID: R-000-28E
31
TÃTULO: Nonlinearities, the generators perspective in ADC statistical testing techniques
AUTORES: Martins, RC; Serra, AC;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Martins, RC; Serra, AC;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: 
Scopus
Scopus NO MEU: 
ORCID
ORCID32
TÃTULO: Uncertainty in the ADC transition voltages determined with the histogram method
AUTORES: Corrêa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Corrêa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID33
TÃTULO: Improving convergence of sine fitting algorithms
AUTORES: Fonseca Da Silva, M; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Fonseca Da Silva, M; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID34
TÃTULO: ADC testing based on IEEE 1057-94 Standard - some critical notes
AUTORES: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLICAÇÃO: 2000, FONTE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTORES: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLICAÇÃO: 2000, FONTE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID35
TÃTULO: ADC characterization by using the histogram test stimulated by Gaussian noise Full Text
AUTORES: Raul Carneiro Martins; António Cruz Serra;
PUBLICAÇÃO: 2000, FONTE: Measurement, VOLUME: 27, NÚMERO: 4
AUTORES: Raul Carneiro Martins; António Cruz Serra;
PUBLICAÇÃO: 2000, FONTE: Measurement, VOLUME: 27, NÚMERO: 4
36
TÃTULO: Logic Analyzers
AUTORES: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLICAÇÃO: 1999, FONTE: Wiley Encyclopedia of Electrical and Electronics Engineering
AUTORES: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLICAÇÃO: 1999, FONTE: Wiley Encyclopedia of Electrical and Electronics Engineering
INDEXADO EM: 
CrossRef
CrossRef37
TÃTULO: Volt-Ampere Meters
AUTORES: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLICAÇÃO: 1999, FONTE: Wiley Encyclopedia of Electrical and Electronics Engineering
AUTORES: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLICAÇÃO: 1999, FONTE: Wiley Encyclopedia of Electrical and Electronics Engineering
INDEXADO EM: CrossRef
CrossRef38
TÃTULO: Electric Distortion Measurement
AUTORES: Pedro Silva B S Gir��o; Ant��nio Cruz C Serra; Helena Geirinhas G Ramos ;
PUBLICAÇÃO: 1999, FONTE: Wiley Encyclopedia of Electrical and Electronics Engineering
AUTORES: Pedro Silva B S Gir��o; Ant��nio Cruz C Serra; Helena Geirinhas G Ramos ;
PUBLICAÇÃO: 1999, FONTE: Wiley Encyclopedia of Electrical and Electronics Engineering
INDEXADO EM: CrossRef
CrossRef39
TÃTULO: Taxonomic problems on ADC characterization
AUTORES: Carneiro C Martins; Geirinhas G Ramos ; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
AUTORES: Carneiro C Martins; Geirinhas G Ramos ; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID40
TÃTULO: Use of a noise stimulus in ADC characterization
AUTORES: Carneiro C Martins; Cruz M C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
AUTORES: Carneiro C Martins; Cruz M C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
INDEXADO EM: Scopus
Scopus