Armando Silva Vieira
AuthID: R-000-2J1
31
TITLE: Determination of the composition of light thin films with artificial neural network analysis of Rutherford backscattering experiments
AUTHORS: Matias, V; Ohl, G; Soares, JC ; Barradas, NP ; Vieira, A; Cardoso, S ; Freitas, PP ;
PUBLISHED: 2003, SOURCE: PHYSICAL REVIEW E, VOLUME: 67, ISSUE: 4
AUTHORS: Matias, V; Ohl, G; Soares, JC ; Barradas, NP ; Vieira, A; Cardoso, S ; Freitas, PP ;
PUBLISHED: 2003, SOURCE: PHYSICAL REVIEW E, VOLUME: 67, ISSUE: 4
32
TITLE: A training algorithm for classification of high-dimensional data Full Text
AUTHORS: Vieira, A; Barradas, N ;
PUBLISHED: 2003, SOURCE: NEUROCOMPUTING, VOLUME: 50
AUTHORS: Vieira, A; Barradas, N ;
PUBLISHED: 2003, SOURCE: NEUROCOMPUTING, VOLUME: 50
33
TITLE: Artificial neural networks for automation of Rutherford backscattering spectroscopy experiments and data analysis
AUTHORS: Barradas, NP ; Vieira, A; Patricio, R;
PUBLISHED: 2002, SOURCE: PHYSICAL REVIEW E, VOLUME: 65, ISSUE: 6
AUTHORS: Barradas, NP ; Vieira, A; Patricio, R;
PUBLISHED: 2002, SOURCE: PHYSICAL REVIEW E, VOLUME: 65, ISSUE: 6
34
TITLE: RBS without humans Full Text
AUTHORS: Barradas, NP ; Vieira, A; Patricio, R;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
AUTHORS: Barradas, NP ; Vieira, A; Patricio, R;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
35
TITLE: Analysis of sapphire implanted with different elements using artificial neural networks Full Text
AUTHORS: Vieira, A; Barradas, NP ; Alves, E ;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
AUTHORS: Vieira, A; Barradas, NP ; Alves, E ;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
36
TITLE: Artificial neural network analysis of RBS data of Er-implanted sapphire Full Text
AUTHORS: Barradas, NP ; Vieira, A; Alves, E ;
PUBLISHED: 2001, SOURCE: 12th International Conference on Ion Beam Modification of Materials (IBMM2000) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 175
AUTHORS: Barradas, NP ; Vieira, A; Alves, E ;
PUBLISHED: 2001, SOURCE: 12th International Conference on Ion Beam Modification of Materials (IBMM2000) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 175
37
TITLE: Composition of NiTaC films on Si using neural networks analysis of elastic backscattering data Full Text
AUTHORS: Vieira, A; Barradas, NP ;
PUBLISHED: 2001, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 174, ISSUE: 3
AUTHORS: Vieira, A; Barradas, NP ;
PUBLISHED: 2001, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 174, ISSUE: 3
38
TITLE: Artificial neural network algorithm for analysis of Rutherford backscattering data
AUTHORS: Barradas, NP ; Vieira, A;
PUBLISHED: 2000, SOURCE: PHYSICAL REVIEW E, VOLUME: 62, ISSUE: 4
AUTHORS: Barradas, NP ; Vieira, A;
PUBLISHED: 2000, SOURCE: PHYSICAL REVIEW E, VOLUME: 62, ISSUE: 4
39
TITLE: Neural network analysis of Rutherford backscattering data Full Text
AUTHORS: Vieira, A; Barradas, NP ;
PUBLISHED: 2000, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 170, ISSUE: 1-2
AUTHORS: Vieira, A; Barradas, NP ;
PUBLISHED: 2000, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 170, ISSUE: 1-2
40
TITLE: A two-dimensional regularization algorithm for density profile evaluation from broadband reflectometry Full Text
AUTHORS: Nunes, F ; Varela, P; Silva, A; Manso, M; Santos, J ; Nunes, I ; Serra, F; Kurzan, B; Suttrop, W;
PUBLISHED: 1997, SOURCE: 11th Topical Conference on High-Temperature Plasma Diagnostics in REVIEW OF SCIENTIFIC INSTRUMENTS, VOLUME: 68, ISSUE: 1
AUTHORS: Nunes, F ; Varela, P; Silva, A; Manso, M; Santos, J ; Nunes, I ; Serra, F; Kurzan, B; Suttrop, W;
PUBLISHED: 1997, SOURCE: 11th Topical Conference on High-Temperature Plasma Diagnostics in REVIEW OF SCIENTIFIC INSTRUMENTS, VOLUME: 68, ISSUE: 1
