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TITLE: Ion Beam Analysis of Ge/Si Dots Grown on Ultrathin SiO<sub>2</sub> Interlayers
AUTHORS: Alexandra Fonseca; Eduardo Alves; Joaquim P Leitão; Nikolai A Sobolev; Celeste C Carmo; Alexander I Nikiforov;
PUBLISHED: 2006, SOURCE: Materials Science Forum, VOLUME: 514-516
INDEXED IN: CrossRef
IN MY: ORCID
332
TITLE: Microstructural characterization of Eurofer-ODS RAFM steel in the normalized and tempered condition and after thermal aging in simulated fusion conditions  Full Text
AUTHORS: Paúl, A; Alves, E; L.C Alves; Marques, C; Lindau, R; J.A Odriozola;
PUBLISHED: 2005, SOURCE: Fusion Engineering and Design, VOLUME: 75-79
INDEXED IN: CrossRef
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333
TITLE: Electrical conductivity of as-grown and oxidized MgO:Li crystals implanted with Li ions  Full Text
AUTHORS: Tardı́o, M; Ramı́rez, R; González, R; J.V Pinto; R.C da Silva; Alves, E; Chen, Y;
PUBLISHED: 2004, SOURCE: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, VOLUME: 218
INDEXED IN: CrossRef
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334
TITLE: Erratum to “Optical absorption of a Li-related impurity in ZnO”  Full Text
AUTHORS: Deirdre Mc Cabe; Karl Johnston; Martin O. Henry; Enda Mc Glynn; Eduardo Alves; John Davies, J;
PUBLISHED: 2004, SOURCE: Physica B: Condensed Matter, VOLUME: 351, ISSUE: 1-2
INDEXED IN: CrossRef
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335
TITLE: Structural characterisation of SiC/SiCf composites exposed to chemical interaction with Be at high temperature  Full Text
AUTHORS: Paúl, A; L.C Alves; Alves, E; Riccardi, B;
PUBLISHED: 2003, SOURCE: Fusion Engineering and Design, VOLUME: 69, ISSUE: 1-4
INDEXED IN: CrossRef
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336
TITLE: Nanoindentation on MgO crystals implanted with lithium ions  Full Text
AUTHORS: Cáceres, D; Vergara, I; González, R; Chen, Y; Alves, E;
PUBLISHED: 2002, SOURCE: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, VOLUME: 191, ISSUE: 1-4
INDEXED IN: CrossRef
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337
TITLE: Electrical conductivity of MgO crystals implanted with lithium ions  Full Text
AUTHORS: Tardı́o, M; Ramı́rez, R; González, R; Chen, Y; Alves, E;
PUBLISHED: 2002, SOURCE: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, VOLUME: 191, ISSUE: 1-4
INDEXED IN: CrossRef
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338
TITLE: Erratum: “Interpretation of double x-ray diffraction peaks from InGaN layers” [Appl. Phys. Lett. 79, 1432 (2001)]  Full Text
AUTHORS: Pereira, S; Correia, MR; Pereira, E; O’Donnell, KP; Alves, E; Sequeira, AD; Franco, N;
PUBLISHED: 2002, SOURCE: Appl. Phys. Lett. - Applied Physics Letters, VOLUME: 80, ISSUE: 2
INDEXED IN: CrossRef: 5
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339
TITLE: Preparation and study of U/Co multilayers
AUTHORS: Diego, M; Rosa, MA; Lopes, EB; Alves, E; Sequeira, AD; Barradas, NP; Godinho, M; Almeida, M; Gonçalves, AP;
PUBLISHED: 2002, SOURCE: Journal of Nuclear Science and Technology, VOLUME: 39, ISSUE: sup3
INDEXED IN: Scopus CrossRef
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340
TITLE: Depth Resolved Studies of Indium Content and Strain in InGaN Layers  Full Text
AUTHORS: Pereira, S; M.R Correia; Pereira, E; K.P O'Donnell; Trager-Cowan, C; Sweeney, F; Alves, E; A.D Sequeira; Franco, N; I.M Watson;
PUBLISHED: 2001, SOURCE: physica status solidi (b) - phys. stat. sol. (b), VOLUME: 228, ISSUE: 1
INDEXED IN: CrossRef
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