João Manuel de Almeida Serra
AuthID: R-000-73M
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TÃTULO: Silicon film deposition on crystalline, sintered and powder substrates using an inline optical processing CVD system. Silicon film deposition on crystalline, sintered and powder substrates using an inline optical processing CVD system Full Text
AUTORES: Andre Augusto; Filipe Serra; Antonio Vallera; Joao M Serra;
PUBLICAÇÃO: 2014, FONTE: European-Materials-Research-Society Spring Meeting / Symposium X on Materials Research for Group IV Semiconductors - Growth, Characterization, and Technological Developments in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 11-12, VOLUME: 11, NÚMERO: 11-12
AUTORES: Andre Augusto; Filipe Serra; Antonio Vallera; Joao M Serra;
PUBLICAÇÃO: 2014, FONTE: European-Materials-Research-Society Spring Meeting / Symposium X on Materials Research for Group IV Semiconductors - Growth, Characterization, and Technological Developments in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 11-12, VOLUME: 11, NÚMERO: 11-12
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TÃTULO: Room temperature kerfless silicon thin foils obtained via a stress inducing epoxy layer. Room temperature kerfless silicon thin foils obtained via a stress inducing epoxy layer Full Text
AUTORES: Joao Serra; Pierre Bellanger; Pierre O Bouchard; Marc Bernacki;
PUBLICAÇÃO: 2014, FONTE: European-Materials-Research-Society Spring Meeting / Symposium X on Materials Research for Group IV Semiconductors - Growth, Characterization, and Technological Developments in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 11-12, VOLUME: 11, NÚMERO: 11-12
AUTORES: Joao Serra; Pierre Bellanger; Pierre O Bouchard; Marc Bernacki;
PUBLICAÇÃO: 2014, FONTE: European-Materials-Research-Society Spring Meeting / Symposium X on Materials Research for Group IV Semiconductors - Growth, Characterization, and Technological Developments in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 11-12, VOLUME: 11, NÚMERO: 11-12
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TÃTULO: The CLOUD data acquisition system and online derivation of nucleation rates Full Text
AUTORES: Dias, A; Almeida, J; Amorim, A; David, A; Tomé, A; CLOUD Collaboration, ;
PUBLICAÇÃO: 2013, FONTE: 19th International Conference on Nucleation and Atmospheric Aerosols (ICNAA) in NUCLEATION AND ATMOSPHERIC AEROSOLS, VOLUME: 1527
AUTORES: Dias, A; Almeida, J; Amorim, A; David, A; Tomé, A; CLOUD Collaboration, ;
PUBLICAÇÃO: 2013, FONTE: 19th International Conference on Nucleation and Atmospheric Aerosols (ICNAA) in NUCLEATION AND ATMOSPHERIC AEROSOLS, VOLUME: 1527
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TÃTULO: Electric molten zone crystallization of silicon wafers Full Text
AUTORES: Costa, I; Brito, MC; Gaspar, G; Serra, JM; Maia M Alves; Vallera, A;
PUBLICAÇÃO: 2013, FONTE: SEMICONDUCTOR SCIENCE AND TECHNOLOGY, VOLUME: 28, NÚMERO: 12
AUTORES: Costa, I; Brito, MC; Gaspar, G; Serra, JM; Maia M Alves; Vallera, A;
PUBLICAÇÃO: 2013, FONTE: SEMICONDUCTOR SCIENCE AND TECHNOLOGY, VOLUME: 28, NÚMERO: 12
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TÃTULO: Comparative Study of Stress Inducing Layers to Produce Kerfless Thin Wafers by the Slim-cut Technique Full Text
AUTORES: Serra, JM; Bellanger, P; Lobato, K; Martini, R; Debucquoy, M; Poortmans, J;
PUBLICAÇÃO: 2013, FONTE: 39th IEEE Photovoltaic Specialists Conference (PVSC) in 2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
AUTORES: Serra, JM; Bellanger, P; Lobato, K; Martini, R; Debucquoy, M; Poortmans, J;
PUBLICAÇÃO: 2013, FONTE: 39th IEEE Photovoltaic Specialists Conference (PVSC) in 2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
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TÃTULO: Measurement of the dopant concentration in a semiconductor using the Seebeck effect Full Text
AUTORES: Pó, JM; Brito, MC; Maia M Alves; Silva, JA; Serra, JM; Vallêra, AM;
PUBLICAÇÃO: 2013, FONTE: Measurement Science and Technology - Meas. Sci. Technol., VOLUME: 24, NÚMERO: 5
AUTORES: Pó, JM; Brito, MC; Maia M Alves; Silva, JA; Serra, JM; Vallêra, AM;
PUBLICAÇÃO: 2013, FONTE: Measurement Science and Technology - Meas. Sci. Technol., VOLUME: 24, NÚMERO: 5
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TÃTULO: Characterization of recrystallized sintered silicon substrates for photovoltaic's solar cells
AUTORES: Sow, A; Bellanger, P; Dupont, F; Serra, J; Alonso Vante, N; Straboni, A;
PUBLICAÇÃO: 2012, FONTE: 2nd International Conference on Crystalline Silicon Photovoltaics (SiliconPV) in PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS (SILICONPV 2012), VOLUME: 27
AUTORES: Sow, A; Bellanger, P; Dupont, F; Serra, J; Alonso Vante, N; Straboni, A;
PUBLICAÇÃO: 2012, FONTE: 2nd International Conference on Crystalline Silicon Photovoltaics (SiliconPV) in PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS (SILICONPV 2012), VOLUME: 27
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TÃTULO: Tocilizumab: is there life beyond anti-TNF blockade?. Tocilizumab in Rheumatoid Arthritis Full Text
AUTORES: Alves, JD ; Marinho, A; Serra, MJ;
PUBLICAÇÃO: 2011, FONTE: INTERNATIONAL JOURNAL OF CLINICAL PRACTICE, VOLUME: 65, NÚMERO: 4
AUTORES: Alves, JD ; Marinho, A; Serra, MJ;
PUBLICAÇÃO: 2011, FONTE: INTERNATIONAL JOURNAL OF CLINICAL PRACTICE, VOLUME: 65, NÚMERO: 4
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TÃTULO: Linear electric molten zone in semiconductors Full Text
AUTORES: António M Valle^ra; Jorge Maia Alves; João M Serra; Miguel C Brito; Roberto M Gamboa;
PUBLICAÇÃO: 2007, FONTE: Appl. Phys. Lett. - Applied Physics Letters, VOLUME: 90, NÚMERO: 23
AUTORES: António M Valle^ra; Jorge Maia Alves; João M Serra; Miguel C Brito; Roberto M Gamboa;
PUBLICAÇÃO: 2007, FONTE: Appl. Phys. Lett. - Applied Physics Letters, VOLUME: 90, NÚMERO: 23
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TÃTULO: Thin films production, characterization and applications to high temperature measurements
AUTORES: Lourenco, MJ; Serra, JM; Nunes, MR; de Castro, CAN;
PUBLICAÇÃO: 1998, FONTE: Symposium on Integrated Thin Films and Applications, at the 99th Annual Meeting of the American-Ceramic-Society in INTEGRATED THIN FILMS AND APPLICATIONS, VOLUME: 86
AUTORES: Lourenco, MJ; Serra, JM; Nunes, MR; de Castro, CAN;
PUBLICAÇÃO: 1998, FONTE: Symposium on Integrated Thin Films and Applications, at the 99th Annual Meeting of the American-Ceramic-Society in INTEGRATED THIN FILMS AND APPLICATIONS, VOLUME: 86
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