José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
121
TÃTULO: Flow meters: Part 1
AUTORES: Miguel Pereira;
PUBLICAÇÃO: 2009, FONTE: IEEE Instrumentation & Measurement Magazine, VOLUME: 12, NÚMERO: 1
AUTORES: Miguel Pereira;
PUBLICAÇÃO: 2009, FONTE: IEEE Instrumentation & Measurement Magazine, VOLUME: 12, NÚMERO: 1
122
TÃTULO: A four-terminal water-quality-monitoring conductivity sensor
AUTORES: Pedro M Ramos ; Dias M D Pereira; Helena Geirinhas G Ramos ; Lopes L Ribeiro;
PUBLICAÇÃO: 2008, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 57, NÚMERO: 3
AUTORES: Pedro M Ramos ; Dias M D Pereira; Helena Geirinhas G Ramos ; Lopes L Ribeiro;
PUBLICAÇÃO: 2008, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 57, NÚMERO: 3
123
TÃTULO: Next Generation Application Processor Based on the IEEE 1451.1 Standard and Web Services Full Text
AUTORES: Vitor Viegas; Dias M D Pereira; Silva S Girao;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTORES: Vitor Viegas; Dias M D Pereira; Silva S Girao;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
124
TÃTULO: Distributed Instrumentation and Geographic Information System for Dolphins' Environment Assessment Full Text
AUTORES: Postolache, O ; Girao, PS; Patricio, G; Sacramento, J; Macedo, P; Pereira, MD;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTORES: Postolache, O ; Girao, PS; Patricio, G; Sacramento, J; Macedo, P; Pereira, MD;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
125
TÃTULO: NDT on Aluminum Aircraft Plates based on Eddy Current Sensing and Image Processing Full Text
AUTORES: Postolache, O ; Pereira, MD; Ramos, HG ; Lopes L Ribeiro;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTORES: Postolache, O ; Pereira, MD; Ramos, HG ; Lopes L Ribeiro;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
126
TÃTULO: Research on Missing Value Estimation in Data Mining
AUTORES: Deng Chao Feng; Zhe Wang; Jian Fang Shi; Dias M D Pereira;
PUBLICAÇÃO: 2008, FONTE: 7th World Congress on Intelligent Control and Automation in 2008 7TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION, VOLS 1-23
AUTORES: Deng Chao Feng; Zhe Wang; Jian Fang Shi; Dias M D Pereira;
PUBLICAÇÃO: 2008, FONTE: 7th World Congress on Intelligent Control and Automation in 2008 7TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION, VOLS 1-23
127
TÃTULO: A brief tutorial on the IEEE 1451.1 Standard - Part 13 in a series of tutorials in instrumentation and measurement Full Text
AUTORES: Viegas, V; Dias Pereira, JM; Silva Girao, PMB ;
PUBLICAÇÃO: 2008, FONTE: IEEE Instrumentation and Measurement Magazine, VOLUME: 11, NÚMERO: 2
AUTORES: Viegas, V; Dias Pereira, JM; Silva Girao, PMB ;
PUBLICAÇÃO: 2008, FONTE: IEEE Instrumentation and Measurement Magazine, VOLUME: 11, NÚMERO: 2
128
TÃTULO: Dolphins' environment assessment and knowledge management using a distributed instrumentation and geographic information system
AUTORES: Postolache, O ; Apolonia, J; Beirante, N; Macedo, P ; Pereira, MD; Girao, P;
PUBLICAÇÃO: 2008, FONTE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
AUTORES: Postolache, O ; Apolonia, J; Beirante, N; Macedo, P ; Pereira, MD; Girao, P;
PUBLICAÇÃO: 2008, FONTE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXADO EM: 
Scopus
Scopus NO MEU: 
ORCID
ORCID129
TÃTULO: Improving accuracy and linearity of low-cost flow meters
AUTORES: Pereira, MD; Postolache, O ; Girao, PS;
PUBLICAÇÃO: 2008, FONTE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
AUTORES: Pereira, MD; Postolache, O ; Girao, PS;
PUBLICAÇÃO: 2008, FONTE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID130
TÃTULO: A brief tutorial on the IEEE 1451.1 standard
AUTORES: Viegas, V; Pereira, M; Girao, P;
PUBLICAÇÃO: 2008, FONTE: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, VOLUME: 11, NÚMERO: 2
AUTORES: Viegas, V; Pereira, M; Girao, P;
PUBLICAÇÃO: 2008, FONTE: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, VOLUME: 11, NÚMERO: 2
INDEXADO EM: 
WOS
WOS NO MEU: ORCID
ORCID