José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
191
TÃTULO: SDI-12 based turbidity measurement system with field calibration capability Full Text
AUTORES: Pereira, JMD; Postolache, O ; Girao, PS; Ramos, H ;
PUBLICAÇÃO: 2004, FONTE: Canadian Conference on Electrical and Computer Engineering; Technology Driving Innovation, 2004 in Canadian Conference on Electrical and Computer Engineering, VOLUME: 4
AUTORES: Pereira, JMD; Postolache, O ; Girao, PS; Ramos, H ;
PUBLICAÇÃO: 2004, FONTE: Canadian Conference on Electrical and Computer Engineering; Technology Driving Innovation, 2004 in Canadian Conference on Electrical and Computer Engineering, VOLUME: 4
192
TÃTULO: Distributed water quality measurement system based on SDI-12
AUTORES: Ramos, HG ; Girao, P; Postolache, O ; Pereira, M;
PUBLICAÇÃO: 2004, FONTE: 7th Africon Conference in Africa in 2004 IEEE AFRICON: 7TH AFRICON CONFERENCE IN AFRICA, VOLS 1 AND 2: TECHNOLOGY INNOVATION, VOLUME: 1
AUTORES: Ramos, HG ; Girao, P; Postolache, O ; Pereira, M;
PUBLICAÇÃO: 2004, FONTE: 7th Africon Conference in Africa in 2004 IEEE AFRICON: 7TH AFRICON CONFERENCE IN AFRICA, VOLS 1 AND 2: TECHNOLOGY INNOVATION, VOLUME: 1
INDEXADO EM: 
Scopus 
WOS
Scopus WOS NO MEU: 
ORCID
ORCID193
TÃTULO: Water quality data processing using fuzzy neural networks and Kohonen Self Organizing maps
AUTORES: Postolache, O; Pereira, JMD; Girao, P; Ramos, HG;
PUBLICAÇÃO: 2004, FONTE: 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004 in 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004
AUTORES: Postolache, O; Pereira, JMD; Girao, P; Ramos, HG;
PUBLICAÇÃO: 2004, FONTE: 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004 in 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID194
TÃTULO: Improving performance of encoders based systems using wavelet techniques
AUTORES: Pereira, JMD; Postolache, O; Girao, P;
PUBLICAÇÃO: 2004, FONTE: 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004 in 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004
AUTORES: Pereira, JMD; Postolache, O; Girao, P;
PUBLICAÇÃO: 2004, FONTE: 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004 in 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID195
TÃTULO: Wireless water quality monitoring system based on field point technology and Kohonen Maps
AUTORES: Postolache, O ; Girao, PS; Pereira, JMD; Ramos, H ;
PUBLICAÇÃO: 2003, FONTE: 15th IEEE Canadian Conference on Electrical and Computer Engineering in CCECE 2003: CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-3, PROCEEDINGS: TOWARD A CARING AND HUMANE TECHNOLOGY, VOLUME: 3
AUTORES: Postolache, O ; Girao, PS; Pereira, JMD; Ramos, H ;
PUBLICAÇÃO: 2003, FONTE: 15th IEEE Canadian Conference on Electrical and Computer Engineering in CCECE 2003: CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-3, PROCEEDINGS: TOWARD A CARING AND HUMANE TECHNOLOGY, VOLUME: 3
INDEXADO EM: Scopus WOS
Scopus WOS NO MEU: ORCID
ORCID196
TÃTULO: A remote measurement and control solution for distributed HART systems
AUTORES: Pereira, JMD; Postolache, O ; Girao, PS; Ramos, H ;
PUBLICAÇÃO: 2003, FONTE: 6th International Conference on Electronic Measurement and Instruments in ICEMI'2003: PROCEEDINGS OF THE SIXTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1-3, VOLUME: 1
AUTORES: Pereira, JMD; Postolache, O ; Girao, PS; Ramos, H ;
PUBLICAÇÃO: 2003, FONTE: 6th International Conference on Electronic Measurement and Instruments in ICEMI'2003: PROCEEDINGS OF THE SIXTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1-3, VOLUME: 1
INDEXADO EM: Scopus WOS
Scopus WOS NO MEU: ORCID
ORCID197
TÃTULO: HART protocol analyser based in LabVIEW
AUTORES: Pereira, JMD; Postolache, O; Girao, PS;
PUBLICAÇÃO: 2003, FONTE: 2nd IEEE International Workshop on Intelligent Data Acquisition and Advanced Computing Systems in IDAACS'2003: PROCEEDINGS OF THE SECOND IEEE INTERNATIONAL WORKSHOP ON INTELLIGENT DATA ACQUISITION AND ADVANCED COMPUTING SYSTEMS: TECHNOLOGY AND APPLICATIONS
AUTORES: Pereira, JMD; Postolache, O; Girao, PS;
PUBLICAÇÃO: 2003, FONTE: 2nd IEEE International Workshop on Intelligent Data Acquisition and Advanced Computing Systems in IDAACS'2003: PROCEEDINGS OF THE SECOND IEEE INTERNATIONAL WORKSHOP ON INTELLIGENT DATA ACQUISITION AND ADVANCED COMPUTING SYSTEMS: TECHNOLOGY AND APPLICATIONS
198
TÃTULO: Smart wireless system for pollution control of rivers and estuaries
AUTORES: Postolache, O ; Pereira, M; Banha, C; Girao, P;
PUBLICAÇÃO: 2003, FONTE: 6th International Conference on Electronic Measurement and Instruments in ICEMI'2003: PROCEEDINGS OF THE SIXTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1-3, VOLUME: 2
AUTORES: Postolache, O ; Pereira, M; Banha, C; Girao, P;
PUBLICAÇÃO: 2003, FONTE: 6th International Conference on Electronic Measurement and Instruments in ICEMI'2003: PROCEEDINGS OF THE SIXTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1-3, VOLUME: 2
INDEXADO EM: Scopus WOS
Scopus WOS NO MEU: ORCID
ORCID199
TÃTULO: Self organizing maps application in a remote water quality monitoring system
AUTORES: Postolache, O ; Girao, P; Pereira, M; Ramos, H ;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 1
AUTORES: Postolache, O ; Girao, P; Pereira, M; Ramos, H ;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 1
INDEXADO EM: Scopus WOS
Scopus WOS NO MEU: ORCID
ORCID200
TÃTULO: Dithering performance of oversampled ADC systems affected by hysteresis Full Text
AUTORES: Pereira, JMD; Girao, PS ; Serra, AC ;
PUBLICAÇÃO: 2002, FONTE: MEASUREMENT, VOLUME: 32, NÚMERO: 1
AUTORES: Pereira, JMD; Girao, PS ; Serra, AC ;
PUBLICAÇÃO: 2002, FONTE: MEASUREMENT, VOLUME: 32, NÚMERO: 1
