José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
211
TÃTULO: Fitting transducer characteristics to measured data Full Text
AUTORES: Dias Pereira, JM; Silva Girao, PMB; Postolache, O ;
PUBLICAÇÃO: 2001, FONTE: IEEE Instrumentation and Measurement Magazine, VOLUME: 4, NÚMERO: 4
AUTORES: Dias Pereira, JM; Silva Girao, PMB; Postolache, O ;
PUBLICAÇÃO: 2001, FONTE: IEEE Instrumentation and Measurement Magazine, VOLUME: 4, NÚMERO: 4
212
TÃTULO: Neural network application in a carbon monoxide measurement system
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
INDEXADO EM: 
Scopus
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ORCID
ORCID213
TÃTULO: Neural networks in automated measurement systems: State of the art and new research trends
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTORES: Postolache, O ; Girao, P; Pereira, M;
PUBLICAÇÃO: 2001, FONTE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID214
TÃTULO: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID215
TÃTULO: Microcontroller - based data processing for non-linear measuring sensors
AUTORES: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID216
TÃTULO: Laser based smart displacement sensor
AUTORES: Postolache O.; Pereira M.; Girão P.;
PUBLICAÇÃO: 2001, FONTE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
AUTORES: Postolache O.; Pereira M.; Girão P.;
PUBLICAÇÃO: 2001, FONTE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
217
TÃTULO: Minimizing temperature drift errors of conditioning circuits using artificial neural networks
AUTORES: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLICAÇÃO: 2000, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, NÚMERO: 5
AUTORES: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLICAÇÃO: 2000, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, NÚMERO: 5
218
TÃTULO: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects Full Text
AUTORES: Faria, JB ; Postolache, O ; Pereira, JD; Girao, PS ;
PUBLICAÇÃO: 2000, FONTE: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, VOLUME: 26, NÚMERO: 4
AUTORES: Faria, JB ; Postolache, O ; Pereira, JD; Girao, PS ;
PUBLICAÇÃO: 2000, FONTE: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, VOLUME: 26, NÚMERO: 4
219
TÃTULO: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects
AUTORES: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLICAÇÃO: 2000, FONTE: Microwave and Optical Technology Letters, VOLUME: 26, NÚMERO: 4
AUTORES: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLICAÇÃO: 2000, FONTE: Microwave and Optical Technology Letters, VOLUME: 26, NÚMERO: 4
220
TÃTULO: Dithered ADC systems in the presence of hysteresis errors Full Text
AUTORES: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLICAÇÃO: 1999, FONTE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
AUTORES: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLICAÇÃO: 1999, FONTE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
INDEXADO EM: Scopus 
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