Bias of the Independently Based Gain and Offset Error in Adc Testing Using the Histogram Method

AuthID
P-00Y-HT9
1
Author(s)
Tipo de Documento
Article
Year published
2023
Publicado
in MEASUREMENT, ISSN: 0263-2241
Volume: 218, Páginas: 113181 (8)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85161491076
Wos: WOS:001021020900001
Source Identifiers
ISSN: 0263-2241
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