A Simple Method to Extract the Thermal Resistance of Gan Hemts From De-Trapping Characteristics

AuthID
 P-00Y-M55
5
Author(s)
Gonzalez, B
·
Nunes, LC
·
Gomes, JL
·
Jimenez, JL
Tipo de Documento
Article
Year published
2023
Publicado
in IEEE ELECTRON DEVICE LETTERS, ISSN: 0741-3106
Volume: 44, Número: 6, Páginas: 891-894 (4)
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Publication Identifiers
Wos: WOS:001001401500004
Source Identifiers
ISSN: 0741-3106
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