Accurate Determination of Band Tail Properties in Amorphous Semiconductor Thin Film with Kelvin Probe Force Microscopy

AuthID
 P-00Y-M6D
6
Author(s)
Fabbri, L
·
Bordoni, C
·
Crocco, J
·
Fraboni, B
·
Cramer, T
Tipo de Documento
Article
Year published
2023
Publicado
in APL MATERIALS, ISSN: 2166-532X
Volume: 11, Número: 6
Indexing
Wos®
Scopus®
Crossref®3
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85162750961
Wos: WOS:001011037300003
Source Identifiers
ISSN: 2166-532X
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