Characterization of the Li Beam Probe with a Beam Profile Monitor on Jet

AuthID
 P-003-2P1
6
Author(s)
Korotkov, A
·
Brix, M
·
Morgan, P
·
Vince, J
·
JET EFDA Contributors,
1
Group Author(s)
JET EFDA Contributors
Tipo de Documento
Article
Year published
2010
Publicado
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 81, Número: 10, Páginas: 10D734 (3)
Conference
18Th Topical Conference on High-Temperature Plasma Diagnostics, Date: MAY 16-20, 2010, Location: Wildwood, NJ
Indexing
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Publication Identifiers
Pubmed: 21061478
SCOPUS: 2-s2.0-78149454882
Wos: WOS:000283754000113
Source Identifiers
ISSN: 0034-6748
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