An Enhanced Smart Sampling Algorithm Based on Deep Learning

AuthID
 P-00Y-V4X
6
Author(s)
Carratu, M
·
Dello Iacono, S
·
Gallo, V
·
Paciello, V
·
Monte, G
·
Tipo de Documento
Proceedings Paper
Year published
2023
Publicado
in 2023 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, I2MTC in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 2023-May
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc) - Rising Above Covid-19, Date: MAY 22-25, 2023, Location: Kuala Lumpur, MALAYSIA
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85166381447
Wos: WOS:001039259600169
Source Identifiers
ISSN: 1091-5281
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service