Assessment of the Zero Distortion Bias Point Using Design-Oriented 7-Parameter Mosfet Model

AuthID
 P-00Y-ZXE
3
Author(s)
Pinto, D
·
Toledo, P
·
Tipo de Documento
Proceedings Paper
Year published
2023
Publicado
in Proceedings - 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023
Páginas: 84-88 (4)
Conference
2023 International Young Engineers Forum in Electrical and Computer Engineering, Yef-Ece 2023, Date: 7 July 2023, Location: Lisbon
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Publication Identifiers
SCOPUS: 2-s2.0-85168887835
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