Unlocking the Potential of Dynamic Languages: An Exploration of Automated Unit Test Generation Techniques

AuthID
 P-00Z-3HY
4
Author(s)
Jesus, H
·
Tipo de Documento
Proceedings Paper
Year published
2023
Publicado
in 2023 IEEE INTERNATIONAL CONFERENCE ON ARTIFICIAL INTELLIGENCE TESTING, AITEST in IEEE International Conference on Artificial Intelligence Testing, ISSN: 2835-3552
Páginas: 122-126 (5)
Conference
5Th Ieee International Conference on Artificial Intelligence Testing (Aitest), Date: JUL 17-20, 2023, Location: Harokopio Univ Athens, Athens, GREECE, Host: Harokopio Univ Athens
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Publication Identifiers
SCOPUS: 2-s2.0-85172193909
Wos: WOS:001062490100018
Source Identifiers
ISSN: 2835-3552
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