Characterization of the Density of States of Polymorphous Silicon Films Produced at 13.56 and 27.12 Mhz Using Cpm and Sclc Techniques

AuthID
 P-000-9YK
7
Author(s)
Raniero, L
·
Zhang, SB
·
Tipo de Documento
Article
Year published
2004
Publicado
in JOURNAL OF NON-CRYSTALLINE SOLIDS, ISSN: 0022-3093
Volume: 338, Páginas: 206-210 (5)
Conference
20Th International Conference on Amorphous and Microcrystalline Semiconductors, Date: AUG 25-29, 2003, Location: Campos do Jordao, BRAZIL
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Publication Identifiers
Wos: WOS:000222219000044
Source Identifiers
ISSN: 0022-3093
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