Traceability Issues for Contact Probe and Stylus Instrument Measurements

AuthID
 P-00Z-9SM
16
Author(s)
Astrua, M
·
Muñoz, R
·
Arce, A
·
Oraby, E
·
Trych Wildner, A
·
Slusarski, L
·
Sosinowski, P
·
Baršic, G
·
Šimunovic, V
·
Tamakjarska, D
·
Saraiva, F
·
Zelenika, S
·
Al Qahtani, F
3
Editor(es)
Riemer,O;Nisbet,C;Phillips,D
Tipo de Documento
Proceedings Paper
Year published
2023
Publicado
in European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 23rd International Conference and Exhibition, EUSPEN 2023
Páginas: 433-436 (3)
Conference
23Rd International Conference of the European Society for Precision Engineering and Nanotechnology, Euspen 2023, Date: 12 June 2023 through 16 June 2023, Location: Copenhagen
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-85175177715
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