Publicações

AuthID
P-00Z-BY3

Author(s)

Dai, WB

Tsang, KF

Shi, Y

Hancke, G

Shu, L

Behnam, M

Haase, J

Vyatkin, V

Tipo de Documento

Article in Press

Year published

2023

Publicado

in IEEE INDUSTRIAL ELECTRONICS MAGAZINE, ISSN: 1932-4529

Volume: 18, Número: 2, Páginas: 6-16 (11)

Indexing

Wos^®

Crossref^®1

Google Scholar^®

Publication Identifiers

DOI: 10.1109/mie.2023.3321390

Wos: WOS:001092344000001

Source Identifiers

ISSN: 1932-4529

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