Cohesive Properties of Bimaterial Interfaces in Semiconductors: Experimental Study and Numerical Simulation Using an Inverse Cohesive Contact Approach

AuthID
 P-00Z-Y23
7
Author(s)
Adler, C
·
Morais, P
·
Akhavan-Safar, A
·
Marques, EAS
·
Karunamurthy, B
·
Document Type
Article
Year published
2024
Published
in MATERIALS, ISSN: 1996-1944
Volume: 17, Issue: 2, Pages: 289 (16)
Indexing
Wos®
Scopus®
Crossref®
Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 38255456
Scopus: 2-s2.0-85183314490
Wos: WOS:001151382700001
Source Identifiers
ISSN: 1996-1944
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service