Cohesive Properties of Bimaterial Interfaces in Semiconductors: Experimental Study and Numerical Simulation Using an Inverse Cohesive Contact Approach

AuthID
 P-00Z-Y23
7
Author(s)
Adler, C
·
Morais, P
·
Akhavan-Safar, A
·
Marques, EAS
·
Karunamurthy, B
·
Tipo de Documento
Article
Year published
2024
Publicado
in MATERIALS, ISSN: 1996-1944
Volume: 17, Número: 2, Páginas: 289 (16)
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Publication Identifiers
Pubmed: 38255456
SCOPUS: 2-s2.0-85183314490
Wos: WOS:001151382700001
Source Identifiers
ISSN: 1996-1944
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