Defect Reduction in Silicon Nanoparticles by Low-Temperature Vacuum Annealing

AuthID
 P-003-6RD
7
Author(s)
Stegner, AR
·
Hoeb, M
·
Wiggers, H
·
Brandt, MS
·
Stutzmann, M
Tipo de Documento
Article
Year published
2010
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 96, Número: 19, Páginas: 193112 (3)
Indexing
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Scopus®
Crossref®26
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-77952971786
Wos: WOS:000277756400066
Source Identifiers
ISSN: 0003-6951
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