In Situ Tem Study of Grain Growth in Nanocrystalline Copper Thin Films

AuthID
P-003-7HK
Tipo de Documento
Article
Year published
2010
Publicado
in NANOTECHNOLOGY, ISSN: 0957-4484
Volume: 21, Número: 14, Páginas: 145701 (12)
Indexing
Publication Identifiers
Pubmed: 20215662
SCOPUS: 2-s2.0-77949558091
Wos: WOS:000275652200037
Source Identifiers
ISSN: 0957-4484
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