Dual Frequency Sweeping Interferometry for Absolute Distance Metrology at Long Ranges: Implementation and Performance

AuthID
 P-003-BAG
4
Author(s)
3
Editor(es)
Towers, CE; Schmit, J; Creath, K
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in INTERFEROMETRY XV: TECHNIQUES AND ANALYSIS in Proceedings of SPIE, ISSN: 0277-786X
Volume: 7790
Conference
Conference on Interferometry Xv - Techniques and Analysis, Date: AUG 02-04, 2010, Location: San Diego, CA, Patrocinadores: SPIE
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-78649979660
Wos: WOS:000296025400005
Source Identifiers
ISSN: 0277-786X
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service