Erbium-Doped Nanocrystalline Silicon Thin Films Produced by Rf Sputtering - Annealing Effect on the Er Emission

AuthID
P-003-C99
6
Author(s)
Kozanecki, A
·
1
Editor(es)
Schropp,REI
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4 in Physica Status Solidi C-Current Topics in Solid State Physics, ISSN: 1610-1634
Volume: 7, Número: 3-4, Páginas: 683-687 (5)
Conference
23Rd International Conference on Amorphous and Nanocrystalline Semiconductors (Icans23), Date: AUG 23-28, 2009, Location: Utrecht, NETHERLANDS, Patrocinadores: Utrecht University, Faculty of Science;Inst. Energieforschung - Photovoltaik, Forschungszent. Jul.;Sunfilm AG;Stichting Physica;Foundation for Fundamental Research on Matter
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-77952572993
Wos: WOS:000287213400044
Source Identifiers
ISSN: 1610-1634
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