Improvement of Phase Difference Estimation Using Modified Ellipse Fit Method

AuthID
 P-003-DCR
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Páginas: 78-81 (4)
Conference
International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 03-06, 2010, Location: Austin, TX, Patrocinadores: IEEE
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Publication Identifiers
SCOPUS: 2-s2.0-77957857050
Wos: WOS:000287997200015
Source Identifiers
ISSN: 1091-5281
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