The Impact of Long-Term Memory Effects on Diode Power Probes

AuthID
 P-003-DDP
5
Author(s)
Gomes, H
·
Testera, AR
·
Barciela, MF
·
Remley, KA
Tipo de Documento
Abstract
Year published
2010
Publicado
in 2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Conference
Ieee Mtt-S International Microwave Symposium Digest, Date: MAY 23-28, 2010, Location: Anaheim, CA, Patrocinadores: IEEE
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Wos®
Publication Identifiers
Wos: WOS:000288196502057
Source Identifiers
ISSN: 0149-645X
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