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Electric Charge Transport and Trapping in Dielectrics Deduced from Isothermal and Non-Isothermal Measurements

AuthID
P-000-AZ5

Author(s)

Neagu, ER

Marat Mendes, JN

Tipo de Documento

Article

Year published

2004

Publicado

in IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, ISSN: 1070-9878

Volume: 11, Número: 2, Páginas: 249-254 (6)

Conference

11Th International Symposium on Electrets (Ise 11), Date: OCT 01-03, 2002, Location: MELBOURNE, AUSTRALIA, Patrocinadores: IEEE Dielect & Elect Insulat Soc, IEEE Ultrason & Frequency Control Soc

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Publication Identifiers

DOI: 10.1109/tdei.2004.1285894

SCOPUS: 2-s2.0-2342557463

Wos: WOS:000220708200009

Source Identifiers

ISSN: 1070-9878

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Electric Charge Transport and Trapping in Dielectrics Deduced from Isothermal and Non-Isothermal Measurements

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Electric Charge Transport and Trapping in Dielectrics Deduced from Isothermal and Non-Isothermal Measurements

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