Stability of Indium-Oxide Thin-Film Transistors by Reactive Ion Beam Assisted Deposition

AuthID
 P-003-FMY
6
Author(s)
Wang, K
·
Chaji, R
·
Robertson, J
·
Nathan, A
Tipo de Documento
Article
Year published
2009
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 517, Número: 23, Páginas: 6341-6344 (4)
Conference
6Th Symposium on Thin Films for Large Area Electronics Held at the E-Mrs Spring Meeting, Date: MAY 26-30, 2008, Location: Strasbourg, FRANCE, Patrocinadores: E-MRS
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Publication Identifiers
SCOPUS: 2-s2.0-68349096402
Wos: WOS:000269930400031
Source Identifiers
ISSN: 0040-6090
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