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Soft X-Ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions
AuthID
P-003-FQ8
P-003-FQ8
34
Author(s)
Nelson, AJ
·Toleikis, S
·Chapman, H
·Bajt, S
·Krzywinski, J
·Chalupsky, J
·Juha, L
·Cihelka, J
·Hajkova, V
·[+3]·
[+1]·
[+10]·
Andreasson, J
·Wark, JS
·Riley, D
·Tschentscher, T
·Hajdu, J
·Lee, RW
Tipo de Documento
Article
Year published
2009
Publicado
in OPTICS EXPRESS, ISSN: 1094-4087
Volume: 17, Número: 20, Páginas: 18271-18278 (8)
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ISSN: 1094-4087
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| Name Order | Nome | Name Order | Nome | Name Order | Nome | ||
|---|---|---|---|---|---|---|---|
| 1 | Nelson, AJ; | 2 | Toleikis, S; | 3 | Chapman, H; | ||
| 4 | Bajt, S; | 5 | Krzywinski, J; | 6 | Chalupsky, J; | ||
| 7 | Juha, L; | 8 | Cihelka, J; | 9 | Hajkova, V; | ||
| 10 | Vysin, L; | 11 | Burian, T; | 12 | Kozlova, M; | ||
| 13 | Faeustlin, RR; | 14 | Nagler, B; | 15 | Vinko, SM; | ||
| 16 | Whitcher, T; | 17 | Dzelzainis, T; | 18 | Renner, O; | ||
| 19 | Saksl, K; | 20 | Khorsand, AR; | 21 | Heimann, PA; | ||
| 22 | Sobierajski, R; | 23 | Klinger, D; | 24 | Jurek, M; | ||
| 25 | Pelka, J; | 26 | Iwan, B; | 27 | Andreasson, J; | ||
| 28 | Timneanu, N; | 29 | Fajardo, M ; | 30 | Wark, JS; | ||
| 31 | Riley, D; | 32 | Tschentscher, T; | 33 | Hajdu, J; | ||
| 34 | Lee, RW; |
