Electrical, Structural and Optical Characterization of Copper Oxide Thin Films as a Function of Post Annealing Temperature

AuthID
 P-003-GFF
8
Author(s)
Figueiredo, V
·
Elangovan, E
·
Park, SHK
·
Tipo de Documento
Article
Year published
2009
Publicado
in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, ISSN: 1862-6300
Volume: 206, Número: 9, Páginas: 2143-2148 (6)
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Publication Identifiers
SCOPUS: 2-s2.0-70349137100
Wos: WOS:000270440100039
Source Identifiers
ISSN: 1862-6300
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