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Failure Analysis of Scratch Damaged Shot Peened Simulated Components at High Temperature

AuthID
P-003-JEY

Author(s)

Claudio, RA

Burgess, A

Branco, CM

Byrne, J

Tipo de Documento

Article

Year published

2009

Publicado

in ENGINEERING FAILURE ANALYSIS, ISSN: 1350-6307

Volume: 16, Número: 4, Páginas: 1208-1220 (13)

Conference

3Rd International Conference on Engineering Failure Analysis (Icefa-3), Date: JUL 13-16, 2008, Location: Sitges, SPAIN, Patrocinadores: Elsevier, Engn Failure Anal

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Publication Identifiers

DOI: 10.1016/j.engfailanal.2008.07.013

SCOPUS: 2-s2.0-62649090082

Wos: WOS:000265517900021

Source Identifiers

ISSN: 1350-6307

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Failure Analysis of Scratch Damaged Shot Peened Simulated Components at High Temperature

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