Transmission Electron Microscopy Study on the Crystallization of Ion Beam Assisted Deposited Cofeb/Mgo/Cofeb Magnetic Tunnel Junctions with Tantalum Capping Layer

AuthID
 P-013-XPE
6
Author(s)
Petrova, R
·
Ferreira, R
·
Freitas, P
·
McVitie, S
·
Chapman, J
Document Type
Article
Year published
2011
Published
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 17, Issue: S2, Pages: 1860-1861
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ISSN: 1431-9276
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